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List of works by Sakari Sintonen

Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion

scholarly article by Oili M.E. Ylivaara et al published February 2014 in Thin Solid Films

An investigation of structural properties of GaN films grown on patterned sapphire substrates by MOVPE

Analysis of Dislocations Generated during Metal–Organic Vapor Phase Epitaxy of GaN on Patterned Templates

Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN

article

Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

article published in 2010

Defect structure of a free standing GaN wafer grown by the ammonothermal method

Diamond-like carbon (DLC) thin film bioelectrodes: effect of thermal post-treatments and the use of Ti adhesion layer

scientific article

Effect of growth temperature on the epitaxial growth of ZnO on GaN by ALD

Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography

Fabrication of GaN structures with embedded network of voids using pillar patterned GaN templates

Large-area analysis of dislocations in ammonothermal GaN by synchrotron radiation X-ray topography

MOCVD growth and characterization of near-surface InGaN/GaN single quantum wells for non-radiative coupling of optical excitations

Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO2 on a silicon substrate

Patterning of sapphire/GaN substrates

Synchrotron X-ray diffraction topography study of bonding-induced strain in silicon-on-insulator wafers

Synchrotron radiation X-ray topography and X-ray diffraction of homoepitaxial GaN grown on ammonothermal GaN

article published in 2012

Synchrotron radiation x-ray topography and defect selective etching analysis of threading dislocations in GaN

Thermal and plasma enhanced atomic layer deposition of SiO2 using commercial silicon precursors

X-ray diffraction study of GaN grown on patterned substrates

X-ray reflectivity characterization of atomic layer deposition Al2O3/TiO2 nanolaminates with ultrathin bilayers

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