3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. I. Flat sample

3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. II. Curved sample

Ambipolar multi-stripe organic field-effect transistors

article

Amorphous Aggregation of Amyloid Beta 1-40 Peptide in Confined Space.

scientific article

Boron doping of silicon rich carbides: Electrical properties

Bragg-Case X-ray Interference in Multilayered Structures. Comparison Between Kinematical Approximation and Dynamical Treatment

Changes of the Molecular Structure in Organic Thin Film Transistors during Operation

article

Coherent X-ray imaging investigation of macrodefects and micropipes on SiC

Conductive sub-micrometric wires of platinum-carbonyl clusters fabricated by soft-lithography

article published in 2008

Continuous tuning of the mechanical sensitivity of Pentacene OTFTs on flexible substrates: From strain sensors to deformable transistors

article

Crystallization of Organic Semiconductor Molecules in Nanosized Cavities: Mechanism of Polymorphs Formation Studied by in Situ XRD

Damage in ion implanted silicon measured by x‐ray diffraction

article published in 1996

Damage profiles in as-implanted silicon: fluence dependence

Damage profiles in as-implanted 〈100〉 Si crystals: strain by X-ray diffractometry versus interstitials by RBS-channeling

Defects formation in sublimation grown 6H-SiC single crystal boules

Depth Profiling of the Lateral Pore Size and Correlation Distance in Thin Porous Silicon Layers by Grazing Incidence Small Angle X-Ray Scattering

Depth resolved investigations of boron implanted silicon

Depth resolved study of impurity sites in low energy ion implanted As in Si

Depth-resolved molecular structure and orientation of polymer thin films by synchrotron X-ray diffraction

Direct On-Surface Patterning of a Crystalline Laminar Covalent Organic Framework Synthesized at Room Temperature

EPR and X-ray diffraction study of damage produced by implantation of B ions (50 keV, 1 MeV) or Si ions (50 keV, 700 keV, 1.5 MeV) into silicon

Effect of the silanization and annealing on the morphology of thin poly(3-hexylthiophene) (P3HT) layer on silicon oxide

Effects of boron-interstitial silicon clusters on interstitial supersaturation during postimplantation annealing

Enhancing the Charge Transport in Solution-Processed Perylene Di-imide Transistors via Thermal Annealing of Metastable Disordered Films

article

Erratum to: “Damage profiles in as-implanted 〈100〉 Si crystals: strain by X-ray diffractometry versus interstitials by RBS-channeling” [Nucl. Instr. and Meth. B 120 (1996) 64–67]

scholarly article published in Nuclear Instruments & Methods in Physics Research B

Graphene exfoliation in the presence of semiconducting polymers for improved film homogeneity and electrical performances

scholarly article in Carbon, vol. 130, April 2018

High spatial resolution X-ray microdiffraction applied to biomaterial studies and archeometry

High, Anisotropic, and Substrate-Independent Mobility in Polymer Field-Effect Transistors Based on Preassembled Semiconducting Nanofibrils

scientific article published on 24 January 2017

High-performance single crystal organic field-effect transistors based on two dithiophene-tetrathiafulvalene (DT-TTF) polymorphs.

scientific article published in October 2010

Influence of the electrolyte viscosity on the structural features of porous silicon

Influence of the supramolecular order on the electrical properties of 1D coordination polymers based materials

Laser induced crystallization of hydrogenated amorphous silicon-carbon alloys

article

Leveraging the Ambipolar Transport in Polymeric Field-Effect Transistors via Blending with Liquid-Phase Exfoliated Graphene

article

Logic-gate devices based on printed polymer semiconducting nanostripes

scientific article

Micro- and nanopatterning of spin-transition compounds into logical structures

article

Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range

Molecular reorganization in organic field-effect transistors and its effect on two-dimensional charge transport pathways

article

Monitoring the crystallization process of nano-confined organic molecules by synchrotron X-ray diffraction

NANOMECHANICAL CHARACTERIZATION OF ZIRCONIA THIN FILMS DEPOSITED ON UHMWPE BY PULSED PLASMA DEPOSITION

Nature and occurrence of defects in 6H-SiC Lely crystals

Non-Destructive Techniques for Identification and Control of Processing Induced Extended Defects in Silicon and Correlation with Device Yield

On the role of the static Debye-Waller factor in X-ray rocking curve analysis

article by Roberto Balboni et al published 16 March 1995 in Physica Status Solidi A

Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon

Photocurrent spectroscopy of ion-implanted organic thin film transistors

article

Porous silicon characterization by x-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam

Pre-amorphization damage study in as-implanted silicon

Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

Real time investigation of the growth of silicon carbide nanocrystals on Si(100) using synchrotron X-ray diffraction

scholarly article by Silvia Milita et al published January 2008 in Applied Surface Science

Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

Selective growth of α-sexithiophene by using silicon oxides patterns

scientific article

Self-Assembly of an Amphiphilic π-Conjugated Dyad into Fibers: Ultrafast and Ultrasensitive Humidity Sensor

scientific article published on 14 April 2015

Spectroscopic investigation of the semiconductor molecular packing in fully operational organic thin-film transistors

article

Strain Sensitivity and Transport Properties in Organic Field-Effect Transistors

article

Structural analyses of thermal annealed SRO/SiO2 superlattices

Structural analysis and depth profiling of nanometric SiO2/SRO multilayers

Structural and optical characterization of two-dimensional arrays of Si nanocrystals embedded in SiO2 for photovoltaic applications

Structural investigation of thin tetracene films on flexible substrate by synchrotron X-ray diffraction

Structural tuning of quinoxaline-benzodithiophene copolymers via alkyl side chain manipulation: synthesis, characterization and photovoltaic properties

Structure and Morphology of PDI8-CN2 for n-Type Thin-Film Transistors

article

Structure and dynamics of pentacene on SiO2: From monolayer to bulk structure

scholarly article in Physical Review B, vol. 85 no. 19, May 2012

Structure and morphology optimization of poly(3-hexylthiophene) thin films onto silanized silicon oxide

Structure, morphology, and growth dynamics of perfluoro-pentacene thin films

Surface nanostructures in manganite films

scientific article published on 19 June 2014

Synchrotron X-ray investigation of tetracene thin films grown at different deposition fluxes

Targeting ordered oligothiophene fibers with enhanced functional properties by interplay of self-assembly and wet lithography

The four polymorphic modifications of the semiconductor dibenzo-tetrathiafulvalene

Thin deposits and patterning of room-temperature-switchable one-dimensional spin-crossover compounds

article published in 2011

Tough and adhesive nanostructured calcium phosphate thin films deposited by the pulsed plasma deposition method

scholarly article in RSC Advances, vol. 5 no. 96, 2015

Tuning the colour and efficiency in OLEDs by using amorphous or polycrystalline emitting layers

Wafer warpage, crystal bending and interface properties of 4H-SiC epi-wafers

X-Ray Diffraction Study of Confined Porous Silicon Membranes

article published in 2001

X-Ray Synchrotron Topography Investigation of Porous Silicon Formed by Patterning in Localized Areas

article published in 2001

X-ray Rocking-Curve Analysis of Crystals with Buried Amorphous Layers. Case of Ion-Implanted Silicon

article by Silvia Milita & M. Servidori published 1 December 1995 in Journal of Applied Crystallography

X-ray diffraction imaging investigation of silicon carbide on insulator structures

scholarly article by Silvia Milita et al published 1 November 2002 in Applied Physics A