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List of works by Mikhail Svechnikov

Application of point diffraction interferometry for measuring angular displacement to a sensitivity of 0.01 arcsec.

scientific article published in November 2015

Application of point diffraction interferometry for middle spatial frequency roughness detection

scientific article published on 01 January 2015

High-reflection Mo/Be/Si multilayers for EUV lithography

scientific article published in December 2017

Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4-250 eV

scientific article published on 01 January 2020

Resolving capacity of the circular Zernike polynomials.

scientific article published on June 2015

Sub-micrometer resolution proximity X-ray microscope with digital image registration

scientific article published on June 2015

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