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List of works by Leszek Bychto

1D or 3D spatial temperature distribution- comparison

Determination of a quantum efficiency of A II –B VI compounds on the basis of photoacoustic spectra

Determination of the Optical Absorption Coefficient Spectra of Thin Semiconductor Layers from Their Photoacoustic Spectra

scientific article published in August 2018

Determination of the optical absorption spectra of thin layers from their photoacoustic spectra

scientific article published in May 2018

Experimental investigations of the dependence of the lifetime of the optically generated minority carriers in n-type silicon on the intensity of its illumination

Experimental verification of new configurations in the piezoelectric photothermal spectroscopy of semiconductor materials

Influence of light intensity on the lifetime of carriers in silicon investigated by a photoacoustic method

Influence of plasma waves on the photoacoustic and piezoelectric spectra of semiconductors

Investigations of AII-BVI mixed crystals with the piezoelectric photothermal method

Investigations of the optical absorption spectra of porous silicon layers on the Silicon backing by the nondestructive photoacoustic method

Investigations of the optical and thermal parameters of porous silicon layers with the two wavelength photoacoustic method

Photoacoustic investigations of the optical absorption spectra of porous silicon layers on a silicon backing

article published in 2010

Photoacoustic spectroscopy analysis of thin semiconductor samples

Photoacoustic studies of Zn1−xBexSe mixed crystals: two-layer approach

Piezoelectric photothermal study of Cd 1-x-y Be x Zn y Se crystals

scientific article published in June 2005

Porous silicon for photosensitized formation of singlet oxygen in water and in simulated body fluid: two methods of modification by undecylenic acid.

scientific article

The influence of the composition of Si–Ge mixed crystals on thermal diffusivity—photoacoustic approach

The model of a thin semiconductor layer on a thermally thick semiconductor backing for the photoacoustic use

Thermal parameters measurement method of electronics materials

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