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List of works by Hao Jiang

Accurate alignment of optical axes of a biplate using a spectroscopic Mueller matrix ellipsometer

scientific article published on 01 May 2016

Accurate characterization of nanoimprinted resist patterns using Mueller matrix ellipsometry

scientific article published on 01 June 2014

Attitude metrology based on the field-of-view effect of birefringence using high-speed polarimetry

scientific article published on 01 April 2020

Cell-substrate interaction with cell-membrane-stress dependent adhesion.

scientific article

Complex Optical Conductivity of Two-Dimensional MoS2: A Striking Layer Dependency

scientific article published on 03 October 2019

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

scientific article published on 01 September 2018

Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology

scientific article

Efficient representation of mask transmittance functions for vectorial lithography simulations

scientific article published on 01 December 2014

Force-moment line element method for flexible slender bodies in Stokes flow.

scientific article published on 30 September 2013

Improved deep-etched multilayer grating reconstruction by considering etching anisotropy and abnormal errors in optical scatterometry

scientific article published on 01 February 2015

Improved measurement accuracy in optical scatterometry using correction-based library search

scientific article

In-line wavefront aberration adjustment of a projection lens for a lithographic tool using the dominant mode method

scientific article published on 01 May 2019

Layer-dependent dielectric and optical properties of centimeter-scale 2D WSe2: evolution from a single layer to few layers

scientific article published on 04 September 2019

Mueller matrix imaging ellipsometry for nanostructure metrology

scientific article published in June 2015

Multiobjective optimization for target design in diffraction-based overlay metrology

scientific article published on 01 March 2020

Nonuniform depolarization properties of typical nanostructures and potential applications

scientific article published on 01 April 2020

On the limits of low-numerical-aperture imaging scatterometry

scientific article published on 01 March 2020

Robust solution to the inverse problem in optical scatterometry.

scientific article published in September 2014

Simulation method for study on outcoupling characteristics of stratified anisotropic OLEDs

scientific article published on 01 August 2019

Wide field-of-view angle linear retarder with an ultra-flat retardance response

scientific article published on 01 June 2019

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