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List of works by Olivier Thomas

3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology

article published in 2010

Comparative study of metallic silicide-germanide orthorhombic MnP systems.

scientific article published on 5 August 2013

Concentration and strain fields inside a Ag/Au core-shell nanowire studied by coherent X-ray diffraction

scientific article published on 19 April 2013

Cubic local order around Al and intermixing in short-period AlN/TiN multilayers studied by Al K-edge extended x-ray absorption fine structure spectroscopy and x-ray diffraction

Direct Observation of Gigahertz Coherent Guided Acoustic Phonons in Free-Standing Single Copper Nanowires ⬇️

scientific article published on 17 November 2014

Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

scientific article published on 10 July 2020

Finite element simulations of coherent diffraction in elastoplastic polycrystalline aggregates

Imaging the facet surface strain state of supported multi-faceted Pt nanoparticles during reaction

scientific article published on 30 May 2022

In situ bending of an Au nanowire monitored by micro Laue diffraction

scientific article published on 30 January 2015

In situ three-dimensional reciprocal-space mapping during mechanical deformation.

scientific article

Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs

scientific article published on 09 January 2003

Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm

scientific article

Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging

article published in 2007

Low-temperature specific heat of MoSi2

scientific article published on 01 June 1988

Methodology for studying strain inhomogeneities in polycrystalline thin films duringin situthermal loading using coherent x-ray diffraction

Nanometer scale assessment of mechanical strain induced in silicon by a periodic line array

scientific article published on 01 October 2011

Piezoelectric Properties of Pb1-xLax(Zr0.52Ti0.48)1-x/4O3 Thin Films Studied by In Situ X-ray Diffraction

scientific article published on 27 July 2020

Pipe-diffusion ripening of Si precipitates in Al-0.5%Cu-1%Si thin films

scientific article published on 21 October 2005

Scanning force microscope for in situ nanofocused X-ray diffraction studies

scientific article

Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

scientific article published in 2021

Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling

scientific article published on 26 June 2020

de Haas-van Alphen effect in MoSi2

scientific article published on 01 May 1987

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