List of works - Yoichi Miyahara

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

scientific article published on 17 October 2019

An apparatus based on an atomic force microscope for implementing tip-controlled local breakdown

scientific article published on 01 December 2019

Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors

scientific article published on 01 January 2019

Cantilever-based sensing: the origin of surface stress and optimization strategies

scientific article published on 18 January 2010

Conductivity of an atomically defined metallic interface ⬇️

scientific article published on November 5, 2012

Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy

scientific article published on 08 February 2005

Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques.

scientific article

Effect of using stencil masks made by focused ion beam milling on permalloy (Ni81Fe19) nanostructures ⬇️

scientific article published on February 28, 2013

Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

scientific article

Excited-state spectroscopy on an individual quantum dot using atomic force microscopy

scientific article

Field deposition from metallic tips onto insulating substrates.

scientific article

Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface

scientific article published on 23 August 2019

HighQoptical fiber tips for NC-AFM in liquid

scientific article published on 10 June 2009

Implementation of atomically defined field ion microscopy tips in scanning probe microscopy ⬇️

scientific article published on August 3, 2012

Improved atomic force microscopy cantilever performance by partial reflective coating.

scientific article published on 3 July 2015

Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surface

scientific article published on 27 November 2012

Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy

scientific article

Minimum Threshold for Incipient Plasticity in the Atomic-Scale Nanoindentation of Au(111)

scientific article published on 27 March 2013

Noise in combined optical microscopy and dynamic force spectroscopy: Toward in vivo hydration measurements

One-to-one spatially matched experiment and atomistic simulations of nanometre-scale indentation.

scientific article published on 12 December 2013

Quantum state readout of individual quantum dots by electrostatic force detection ⬇️

scientific article

Rapid Mechanically Controlled Rewiring of Neuronal Circuits

scientific article

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

scientific article

Relating Franck-Condon blockade to redox chemistry in the single-particle picture

scientific article published on 01 September 2018

Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments.

scientific article

Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopy

scientific article published on 17 March 2015

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

article

Room-temperature single-electron charging detected by electrostatic force microscopy.

scientific article

Scanning gate imaging of two coupled quantum dots in single-walled carbon nanotubes

scientific article published on 21 November 2014

Stochastic noise in atomic force microscopy

scientific article published on 05 September 2012

Strong Electromechanical Coupling of an Atomic Force Microscope Cantilever to a Quantum Dot

scientific article published on 08 January 2010

Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metals

article

List of works by Yoichi Miyahara

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

An apparatus based on an atomic force microscope for implementing tip-controlled local breakdown

Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors

Cantilever-based sensing: the origin of surface stress and optimization strategies

Conductivity of an atomically defined metallic interface ⬇️

Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy

Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques.

Effect of using stencil masks made by focused ion beam milling on permalloy (Ni81Fe19) nanostructures ⬇️

Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

Excited-state spectroscopy on an individual quantum dot using atomic force microscopy

Field deposition from metallic tips onto insulating substrates.

Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface

HighQoptical fiber tips for NC-AFM in liquid

Implementation of atomically defined field ion microscopy tips in scanning probe microscopy ⬇️

Improved atomic force microscopy cantilever performance by partial reflective coating.

Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surface

Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy

Minimum Threshold for Incipient Plasticity in the Atomic-Scale Nanoindentation of Au(111)

Noise in combined optical microscopy and dynamic force spectroscopy: Toward in vivo hydration measurements

One-to-one spatially matched experiment and atomistic simulations of nanometre-scale indentation.

Quantum state readout of individual quantum dots by electrostatic force detection ⬇️

Rapid Mechanically Controlled Rewiring of Neuronal Circuits

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

Relating Franck-Condon blockade to redox chemistry in the single-particle picture

Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments.

Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopy

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

Room-temperature single-electron charging detected by electrostatic force microscopy.

Scanning gate imaging of two coupled quantum dots in single-walled carbon nanotubes

Stochastic noise in atomic force microscopy

Strong Electromechanical Coupling of an Atomic Force Microscope Cantilever to a Quantum Dot

Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metals

Use of an electron-beam evaporator for the creation of nanostructured pits in an insulating surface