List of works - Jonghan Jin

A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices

scientific article published in Scientific Reports

A wide-range optical frequency generator based on the frequency comb of a femtosecond laser

scientific article

Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

scientific article published in June 2006

An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes.

scientific article

An optical absolute position measurement method using a phase-encoded single track binary code ⬇️

scientific article published on November 1, 2012

Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers.

scientific article

High-harmonic generation by resonant plasmon field enhancement

scientific article

High-resolution angle sensor using multiple peak positions of a double slit interference pattern

scientific article published on 01 April 2019

Measurement of refractive index dispersion of a fused silica plate using Fabry-Perot interference

scientific article published on 01 August 2016

Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale

scientific article published on 01 April 2018

Note: High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers.

scientific article

Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating ⬇️

scientific article published on May 1, 2013

Note: high precision angle generator using multiple ultrasonic motors and a self-calibratable encoder

scientific article published on 01 November 2011

Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process ⬇️

scientific article published on February 27, 2012

Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique

scientific article

Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range

scientific article published on 01 August 2019

Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb

scientific article published in May 2017

Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser.

scientific article

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry

scientific article published on 01 March 2014

Vibration-insensitive measurements of the thickness profile of large glass panels.

scientific article published in December 2015

Visibility enhanced interferometer based on an injection-locking technique for low reflective materials

scientific article published on 01 November 2010

Wavelength measurement by Fourier analysis of interference fringes through a plane parallel plate

scientific article published in December 2017

List of works by Jonghan Jin

A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices

A wide-range optical frequency generator based on the frequency comb of a femtosecond laser

Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes.

An optical absolute position measurement method using a phase-encoded single track binary code ⬇️

Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers.

High-harmonic generation by resonant plasmon field enhancement

High-resolution angle sensor using multiple peak positions of a double slit interference pattern

Measurement of refractive index dispersion of a fused silica plate using Fabry-Perot interference

Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale

Note: High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers.

Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating ⬇️

Note: high precision angle generator using multiple ultrasonic motors and a self-calibratable encoder

Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process ⬇️

Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique

Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range

Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb

Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser.

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry

Vibration-insensitive measurements of the thickness profile of large glass panels.

Visibility enhanced interferometer based on an injection-locking technique for low reflective materials

Wavelength measurement by Fourier analysis of interference fringes through a plane parallel plate