Search filters

List of works by Roberto Balboni

Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin films

scientific article published on 01 October 2007

Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures

scientific article published on 10 September 2012

Dynamical simulation of LACBED patterns in cross-sectioned heterostructures

scientific article published on 01 June 2000

EPR and X-ray diffraction study of damage produced by implantation of B ions (50 keV, 1 MeV) or Si ions (50 keV, 700 keV, 1.5 MeV) into silicon

Hydrogen-related complexes as the stressing species in high-fluence, hydrogen-implanted, single-crystal silicon

scientific article published on 01 July 1992

Measuring the orbital angular momentum spectrum of an electron beam

scientific article published on 24 May 2017

Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles

scientific article published on 01 May 2007

Observation of nanoscale magnetic fields using twisted electron beams

scientific article published on 25 September 2017

On the role of the static Debye-Waller factor in X-ray rocking curve analysis

article by Roberto Balboni et al published 16 March 1995 in Physica Status Solidi A

Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon

Phase retrieval of an electron vortex beam using diffraction holography

scientific article published on 27 November 2017

Quantitative thin-film x-ray microanalysis by STEM/HAADF: statistical analysis for precision and accuracy determination

scientific article published in August 2006

Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography

article published in 2017

Structural analysis and depth profiling of nanometric SiO2/SRO multilayers