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List of works by Martin P. Seah

Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profiling

scientific article published in January 2009

Angle dependence of argon gas cluster sputtering yields for organic materials.

scientific article published on 29 January 2015

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.

scientific article published on 5 September 2012

Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?

scientific article published in December 2008

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

scientific article published on September 2015

Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions.

scientific article published on 19 September 2013

Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ions

scientific article published on 14 June 2016

Developing repeatable measurements for reliable analysis of molecules at surfaces using desorption electrospray ionization

scientific article published in March 2009

Diuretic, opiate and nitrate use in severe acidotic acute cardiogenic pulmonary oedema: analysis from the 3CPO trial.

scientific article

Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics

article

Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram

scientific article published on 01 December 2012

Imaging G-SIMS: a novel bismuth-manganese source emitter

scientific article published in August 2008

Mass spectrometry and informatics: distribution of molecules in the PubChem database and general requirements for mass accuracy in surface analysis

scientific article published in April 2011

Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues ⬇️

scientific article published on April 2, 2012

Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios.

scientific article published on 18 March 2009

Nanomechanical measurements of hair as an example of micro-fibre analysis using atomic force microscopy nanoindentation.

scientific article

Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.

scientific article published in January 2010

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources.

scientific article published on 26 February 2016

Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.

scientific article published on 7 February 2008

Relationships between cluster secondary ion mass intensities generated by different cluster primary ions

scientific article published on 5 November 2009

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles

scientific article published on 26 February 2016

Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.

scientific article

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

scientific article published on 22 April 2016

TOF-SIMS: accurate mass scale calibration

scientific article published on 28 February 2006

VAMAS interlaboratory study for desorption electrospray ionization mass spectrometry (DESI MS) intensity repeatability and constancy

scientific article published on 26 September 2014

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