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List of works by David E. Aspnes

Above-band-gap dielectric functions of ZnGeAs2: Ellipsometric measurements and quasiparticle self-consistentGWcalculations

scholarly article in Physical Review B, vol. 83 no. 23, June 2011

Alignment of an optically active biplate compensator

scientific article published on 01 November 1971

Analysis of cermet films with large metal packing fractions

scientific article published on 01 January 1986

Analytic representation of the dielectric functions of InAsxSb1−x alloys in the parametric model

Anisotropies in the Above—Band-Gap Optical Spectra of Cubic Semiconductors

scientific article published on 01 April 1985

Approximate solution of ellipsometric equations for optically biaxial crystals

scientific article published in October 1980

Back-reflection Second-harmonic Generation of (111)Si: Theory and Experiment

article

Biatomic steps on (001) silicon surfaces

scientific article published on 01 December 1986

Bond models in linear and nonlinear optics

Bond models in linear and nonlinear optics

Bond-specific reaction kinetics during the oxidation of (111) Si: Effect of n-type doping

Chemical-etch-assisted growth of epitaxial zinc oxide

Classical Correlation Model of Resonance Raman Spectroscopy

scientific article published on 21 October 2020

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Comments on the determination of the absolute alignment of a polarizer

scientific article published on 01 July 1970

Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation

Correlation of dopant-induced optical transitions with superconductivity in La2-xSrxCuO4- delta

scientific article published on 01 March 1988

Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions

scientific article published on 21 February 2020

Detection and analysis of depolarization artifacts in rotating-compensator polarimeters.

scientific article published in February 2001

Dielectric functions and interband transitions of In1−xAlxSb alloys

Dielectric functions and interband transitions of InxAl1 − xP alloys

Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAs

scientific article published on 01 January 1990

Effect of strain on bond-specific reaction kinetics during the oxidation of H-terminated (111) Si

Eliminating white noise in spectra: A generalized maximum-entropy approach

scientific article published in 2022

Ellipsometric study of single-crystal γ-InSe from 1.5 to 9.2 eV

Exciton-dominated Dielectric Function of Atomically Thin MoS2 Films.

scientific article

Geometrically exact ellipsometer alignment

scientific article published on 01 May 1971

Grain-size effects in the parallel-band absorption spectrum of aluminum.

scientific article published in April 1986

Grating method for determining the absolute angle of incidence of ellipsometric samples in remote locations

scientific article published on 01 February 1992

High precision scanning ellipsometer

scientific article

Imaging performance of mirror pairs for grazing-incidence applications: a comparison

scientific article published on 01 July 1982

Interband transitions and dielectric functions of InGaSb alloys

Kinetic limits of monolayer growth on (001) GaAs by organometallic chemical-vapor deposition

scientific article published on 01 December 1988

Liquid gallium and the eutectic gallium indium (EGaIn) alloy: Dielectric functions from 1.24 to 3.1 eV by electrochemical reduction of surface oxides

scholarly article by Daniel Morales et al published 29 August 2016 in Applied Physics Letters

Measurement and Control of In-Plane Surface Chemistry During Oxidation of H-Terminated (111)Si

Measurement and control of in-plane surface chemistry during the oxidation of H-terminated (111) Si.

scientific article

Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters

scientific article published on March 1978

Multiple determination of the optical constants of thin-film coating materials: a Rh sequel

scientific article published on 01 April 1986

Nondestructive analysis of coated periodic nanostructures from optical data

scientific article

Observation of quasidirect transitions in In1-xGaxP/graded GaP (0.58 <= x <= 0.75) alloys near the Gamma -X1 crossover

scientific article published on 01 February 1995

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)–Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

Optical anisotropy of YBa2Cu3O7-x

scientific article published on 01 September 1988

Optical dielectric response of PdO

scientific article published on 01 December 1992

Optical properties of copper-oxygen planes in superconducting oxides and related materials

scientific article published on 01 October 1989

Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)

scientific article published on 01 October 1987

Optical response of microscopically rough surfaces

scientific article published in May 1990

Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers

scientific article published on 01 November 1994

Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers

scientific article published in March 2004

Oxygen-deficiency-induced localized optical excitations in YBa2Cu

scientific article published on 01 July 1988

Parameterization of the dielectric functions of InGaSb alloys

Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

scientific article published in September 2009

Plasmonics and effective-medium theories

Precision bounds to ellipsometer systems

scientific article published in May 1975

Proximal electromagnetic shear forces

scientific article published in October 1999

Quantitative assessment of linear noise-reduction filters for spectroscopy

scientific article published on 01 December 2020

Real-time observation of atomic ordering in (001) In0.53Ga0.47As epitaxial layers

scientific article published on 01 May 1995

Reflectance-difference spectroscopy of (001) GaAs surfaces in ultrahigh vacuum

scientific article published on 01 December 1992

Roughness Analysis of the Critical Dimension by Using Spectroscopic Ellipsometry

Shallow acceptor complexes in p-type ZnO

article by J. G. Reynolds et al published 15 April 2013 in Applied Physics Letters

Spectroscopic ellipsometry — Past, present, and future

Spectroscopic ellipsometry—A perspective

Surface science at atmospheric pressure: Reconstructions on (001) GaAs in organometallic chemical vapor deposition

scientific article published on 01 February 1992

Surface-Induced Optical Anisotropies of Single-Domain (2 x 1) Reconstructed (001) Si and Ge Surfaces

scientific article published on 01 April 1995

Theory of dielectric-function anisotropies of (001) GaAs (2 x 1) surfaces

scientific article published on 01 June 1990

Thickness inhomogeneities and growth mechanisms of GaP heteroepitaxy by organometallic chemical vapor deposition

Virtual photoconductivity

scientific article published on 01 August 1989

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