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List of works by Andrey Sokolov

At-wavelength metrology facility for soft X-ray reflection optics.

scientific article published on May 2016

Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV.

scientific article published on 11 February 2015

Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASH.

scientific article published in January 2018

Effect of reflection and refraction on NEXAFS spectra measured in TEY mode

scientific article published in January 2018

Efficient high-order suppression system for a metrology beamline

scientific article published in January 2018

Erratum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution.

scientific article published on 25 August 2016

Gratings for synchrotron and FEL beamlines: a project for the manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin.

scientific article

Highly efficient blazed grating with multilayer coating for tender X-ray energies

scientific article published on 01 June 2016

Investigation of the structure of thin HfO(2) films by soft x-ray reflectometry techniques

scientific article published on 31 March 2009

NEXAFS study of electronic and atomic structure of active layer in Al/indium tin oxide/TiO2 stack during resistive switching

scientific article published on 24 June 2016

Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4-250 eV

scientific article published on 01 January 2020

Re-distribution of oxygen at the interface between γ-Al2O3 and TiN

scientific article published on 3 July 2017

Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements.

scientific article published in November 2015

Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks

scientific article (publication date: February 2012)

The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II.

scientific article published on January 2016

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