Search filters

List of works by Rasmus Havelund

3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.

scientific article published on 20 January 2015

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.

scientific article published on 5 September 2012

Argon cluster ion source evaluation on lipid standards and rat brain tissue samples

scientific article published on 07 August 2013

Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

scientific article published on 17 January 2019

Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.

scientific article published on 15 October 2015

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

scientific article published on September 2015

Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ions

scientific article published on 14 June 2016

Direct electrospinning of Ag/polyvinylpyrrolidone nanocables

scientific article published on 12 October 2011

Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics

article

Embedding-Free Method for Preparation of Cross-Sections of Organic Materials for Micro Chemical Analysis Using Gas Cluster Ion Beam Sputtering.

scientific article

Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performance

scientific article published on September 2010

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing

scientific article published on 8 May 2013

Intracellular Drug Uptake-A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS.

scientific article published on 17 October 2017

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

scientific article published on 23 July 2015

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources.

scientific article published on 26 February 2016

SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions.

scientific article published on 21 February 2018

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles

scientific article published on 26 February 2016

Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample

scientific article published on 11 October 2016

Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.

scientific article

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

scientific article published on 22 April 2016

The 3D OrbiSIMS-label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power.

scientific article

The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning

scientific article

Paulina is supported by:

About Paulina

Help