A review of failure modes and mechanisms of GaN-based HEMTs

An Investigation of the Electrical Degradation of GaN High-Electron-Mobility Transistors by Numerical Simulations of DC Characteristics and Scattering Parameters

scientific article published on 10 December 2010

Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation

scientific article published in May 2012

Characterization and analysis of trap-related effects in AlGaN–GaN HEMTs

Comparison between positive and negative constant current stress on dye-sensitized solar cells

Correlation between DC and rf degradation due to deep levels in AlGaN/GaN HEMTs

scientific article published in December 2009

Current Collapse and High-Electric-Field Reliability of Unpassivated GaN/AlGaN/GaN HEMTs

DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues

Efficiency droop in InGaN/GaN blue light-emitting diodes: Physical mechanisms and remedies

Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress

scientific article published in September 2010

False surface-trap signatures induced by buffer traps in AlGaN-GaN HEMTs

Field plate related reliability improvements in GaN-on-Si HEMTs

scientific article published in September 2012

High Breakdown Voltage and Low Buffer Trapping in Superlattice GaN-on-Silicon Heterostructures for High Voltage Applications

scientific article published on 25 September 2020

Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs

scientific article published in September 2013

Impact of temperature on surface-trap-induced gate-lag effects in GaAs heterostructure FETs

Investigation of Efficiency-Droop Mechanisms in Multi-Quantum-Well InGaN/GaN Blue Light-Emitting Diodes

Investigation of High-Electric-Field Degradation Effects in AlGaN/GaN HEMTs

Laser-Based Lighting: Experimental Analysis and Perspectives.

scientific article published on 11 October 2017

Mechanisms of RF Current Collapse in AlGaN–GaN High Electron Mobility Transistors

article

Optical stress and reliability study of ruthenium-based dye-sensitized solar cells (DSSC)

Photon-induced degradation of InGaN-based LED in open-circuit conditions investigated by steady-state photocapacitance and photoluminescence

scientific article published in 2022

Physical Investigation of High-Field Degradation Mechanisms in GaN/AlGaN/GaN HEMTS

Physics-based explanation of kink dynamics in AlGaAs/GaAs HFETs

Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs)

Reliability of Blue-Emitting Eu-Doped Phosphors for Laser-Lighting Applications

scientific article published on 28 August 2018

Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives

article

Reliability study of dye-sensitized solar cells by means of solar simulator and white LED

Study and Development of a Fluorescence Based Sensor System for Monitoring Oxygen in Wine Production: The WOW Project.

scientific article published on 7 April 2018

Study of the effects of UV-exposure on dye-sensitized solar cells

Surface-Related Drain Current Dispersion Effects in AlGaN–GaN HEMTs

Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs)

Trap characterization in buried-gate n-channel 6H-SiC JFETs

Trap energetic and spatial localization in buried-gate 6H-SiC JFETs by means of numerical device simulation

Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability

scientific article published on 23 October 2020

Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment

scientific article published on 17 January 2020