Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions
| Image |  |
|---|---|
| Description | scientific article published on 01 August 2020 |
| Author/s |
author: Simon Maier Dominik J Kirpal Franz Josef Giessibl Korbinian Pürckhauer |
| Publication date | August 1, 2020 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |