Search filters

A Simulation Study on Reducing the Grain Boundary Position Dependency in Tunneling Thin-Film Transistors Using a Wide Tunneling Area

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description scientific article published on 01 November 2020
Author/s

author: Byung-Gook Park  Jong Ho Lee 

Publication date November 1, 2020
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item