Characterizing electronic and atomic structures for amorphous and molecular metal oxide catalysts at functional interfaces by combining soft X-ray spectroscopy and high-energy X-ray scattering
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| Description | scientific article published on 22 June 2020 |
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author: David M Tiede Gihan Kwon Alex Martinson Xiang He Karen Mulfort |
| Publication date | June 22, 2020 |
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