Missing/wrong data? Edit Wikidata item
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
scientific article published on 04 May 2020
Author/s
Work details
Publication date:
May 4, 2020
Language:
Unknown
Country of origin:
Unknown
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.