Visualization of Charge Carrier Trapping in Silicon at the Atomic Surface Level Using Four-Dimensional Electron Imaging
| Image |  |
|---|---|
| Description | scientific article published on 08 April 2019 |
| Author/s |
author: Osman M Bakr Omar F Mohammed Stefaan De Wolf Ahmed M. El-Zohry Basamat S Shaheen Jun Yin |
| Publication date | April 8, 2019 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |