Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor
| Image |  |
|---|---|
| Description | scientific article published on 19 August 2019 |
| Author/s |
author: Hyeon-Jun Lee Katsumi Abe Myoung-Jae Lee |
| Publication date | August 19, 2019 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |