Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction
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| Description | scientific article published on 01 January 2020 |
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author: Tetsuya Ishikawa Noh Do Young Makina Yabashi Kensuke Tono Huaidong Jiang Daewoog Nam Jiadong Fan Heemin Lee |
| Publication date | January 1, 2020 |
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