Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes
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| Description | scientific article published on 08 February 2019 |
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author: Jacek Ryl Artur Zielinski Kazimierz Darowicki Robert Bogdanowicz Michał Sobaszek |
| Publication date | February 8, 2019 |
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