Stress-Induced Crystallization of Thin Hf1- XZr XO2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic Energy Storage Applications
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| Description | scientific article published on 28 January 2019 |
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author: Chadwin D Young Jiyoung Kim Si Joon Kim Harrison Sejoon Kim |
| Publication date | January 28, 2019 |
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