Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography
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| Description | scientific article published on 09 August 2018 |
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author: Ruizhi Wang Peter H Thiesen Philipp Braeuninger-Weimer Stephan Hofmann |
| Publication date | August 9, 2018 |
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