Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
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| Description | scientific article published on 15 October 2019 |
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author: Po-Hsun Chen Wei-Chih Lai Ting-Chang Chang |
| Publication date | October 15, 2019 |
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