Reliable Multivalued Conductance States in TaO x Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis
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| Description | scientific article published on 02 August 2018 |
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author: Minkyung Jung Chun-Yeol You Sung Kyu Park Myoung-Jae Lee |
| Publication date | August 2, 2018 |
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