Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
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| Description | scientific article published on 13 March 2020 |
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author: Andrew M Levine Brent Nannenga Guanhong Bu Adam B Braunschweig Sankarsan Biswas |
| Publication date | March 13, 2020 |
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