Characterizing localized reentry with high-resolution mapping: Evidence for multiple slow conducting isthmuses within the circuit

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Description scientific article published on 28 November 2018
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author: N. Derval  Antonio Frontera  R. Dubois  Konstantinos Vlachos  Takeshi Kitamura  Mélèze Hocini  Arnaud Denis  Frederic Sacher  Thomas Pambrun  Felix Bourier  Josselin Duchateau  Masateru Takigawa  Claire A Martin  Corentin Dallet  Ghassen Cheniti  Michel Haïssaguerre 

Publication date November 28, 2018
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