Role of Sub-Nanometer Dielectric Roughness on Microstructure and Charge Carrier Transport in α,ω-Dihexylsexithiophene Field-Effect Transistors
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| Description | scientific article published on 17 June 2016 |
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author: Klaus Müllen Mengmeng Li Wojciech Pisula Tomasz Marszalek |
| Publication date | June 17, 2016 |
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