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A tandem time-of-flight spectrometer for negative-ion/positive-ion coincidence measurements with soft x-ray excitation
scientific article published on 01 January 2016
Author/s
author: Christian Stråhlman, Antti Kivimäki, Marcello Coreno, Ralf Nyholm, Robert Richter
Work details
Publication date
January 1, 2016
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Language
English
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