Missing/wrong data?
Log in to edit
Determination of Debye-Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientations
scientific article published on 14 October 2010
Author/s
author: Xiahan Sang, Jorg M. Wiezorek
Work details
Publication date
October 14, 2010
-
-
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.