Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate
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| Description | scientific article published on 01 December 2010 |
| Author/s |
author: Seung-Woo Kim |
| Publication date | December 1, 2010 |
| Language | English |
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| Access work |
https://www.osapublishing.org/viewmedia.cfm?URI=ao-49-34-6624&seq=0 |
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| Missing/wrong data? | Edit Wikidata item |