Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)
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| Description | scientific article published on 01 January 1989 |
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author: Ching-Ming Wei |
| Publication date | January 1, 1989 |
| Language | English |
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