Strain in ultrathin epitaxial films of Ge/Si(100) measured by ion scattering and channeling
| Image |  |
|---|---|
| Description | scientific article published on 01 August 1987 |
| Author/s |
author: Bruce Davidson Leonard Feldman |
| Publication date | August 1, 1987 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |