X-ray-diffraction mapping of epitaxial YBa2Cu3O7-x thin films: Determination of in-plane epitaxy and a-, b-, and c-axis lengths in films with varying oxygen deficiency
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| Description | scientific article published on 01 February 1993 |
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author: Ulf Helmersson |
| Publication date | February 1, 1993 |
| Language | English |
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