Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy.
| Image |  |
|---|---|
| Description | scientific article published on 17 May 2019 |
| Author/s |
author: Jasmin Ehrler Alexander Krivcov Hildegard Möbius Tanja Junkers |
| Publication date | May 17, 2019 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |