Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Christian Teichert |
| Publication date | January 15, 2006 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |