Crystallography-Derived Young’s Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy
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| Description | article |
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author: Dmitri Golberg Pavel B. Sorokin Dmitry G Kvashnin Konstantin Firestein Joseph F S Fernando Chao Zhang |
| Publication date | February 27, 2019 |
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