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Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy

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Description scholarly article in Physical Review B, vol. 89 no. 12, March 2014
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author: Gerhard H. Fecher  Claudia Felser  Siham Ouardi  Shigenori Ueda  Gregory Stryganyuk 

Publication date March 17, 2014
Language English
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