Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science
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| Description | scholarly article by Angus Kirkland et al published August 2014 in Microscopy and Microanalysis |
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author: Jamie Warner Konstantin B Borisenko Sarah Jane Haigh |
| Publication date | August 2014 |
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| Missing/wrong data? | Edit Wikidata item |