Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems
| Image |  |
|---|---|
| Description | scholarly article |
| Author/s |
author: Sheila Rowan |
| Publication date | September 10, 2015 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |