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Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering
article by Samuel Tardif et al published 4 August 2016 in Journal of Applied Crystallography
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author: Francois Rieutord, Jérôme Faist, Alban Gassenq, Hans Sigg
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Publication date
August 4, 2016
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