Search filters

Strain distribution in InP grown on patterned Si: Direct visualization by cathodoluminescence wavelength imaging

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description scholarly article by M. Grundmann et al published February 1994 in Journal of Electronic Materials
Author/s

author: Dieter Bimberg 

Publication date February 1994
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item