High-Quality Sample Preparation by Low kV FIB Thinning for Analytical TEM Measurements
| Image |  |
|---|---|
| Description | scientific article published in March 2007 |
| Author/s |
author: Sara Bals Dominique Schryvers |
| Publication date | April 1, 2007 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |