Suppressed Hole-Induced Degradation in E-mode GaN MIS-FETs with Crystalline $\text{GaO}_{\mathrm{x}}\mathrm{N}_{1-\mathrm{x}}$ Channel
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| Description | scientific article published in December 2018 |
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author: Xiangbin Cai Jin Wei |
| Publication date | December 2018 |
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