Atomic Level Modeling of Extremely Thin Silicon-on-Insulator MOSFETs Including the Silicon Dioxide: Electronic Structure
| Image |  |
|---|---|
| Description | scientific article published in March 2015 |
| Author/s |
author: Thomas Frauenheim Hang Xie |
| Publication date | March 2015 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |