Direct Evidence for a Reduced Density of Deep Level Defects at Grain Boundaries ofCu(In,Ga)Se2Thin Films
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| Description | scientific article published in Physical Review Letters |
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author: Harry Mönig Raquel Caballero Iver Lauermann Christian A. Kaufmann Sascha Sadewasser |
| Publication date | September 8, 2010 |
| Language | English |
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