Search filters

Contact end resistance test structure applied for nanocontact measurements

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Joaquín Santander  Gemma Rius  Xavier Borrisé 

Publication date November 2012
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item

Paulina is supported by:

About Paulina

Help