Degradation and Breakdown of Gate Oxides in VLSI Devices
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Xavier Aymerich Nuria Barniol |
| Publication date | February 16, 1989 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |