Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin gate oxide partially depleted SOI nMOSFETs
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Cor Claeys Francesca Campabadal |
| Publication date | September 2005 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |